|
|
| METL5180 | Surface Analysis Techniques | 3+0+0 | ECTS:7.5 | | Year / Semester | Fall Semester | | Level of Course | Second Cycle | | Status | Elective | | Department | DEPARTMENT of METALLURGICAL and MATERIALS ENGINEERING | | Prerequisites and co-requisites | None | | Mode of Delivery | Face to face | | Contact Hours | 14 weeks - 3 hours of lectures per week | | Lecturer | Prof. Dr. Ümit ALVER | | Co-Lecturer | | | Language of instruction | Turkish | | Professional practise ( internship ) | None | | | | The aim of the course: | | The aim of the course is to give information about surface analysis techniques |
| Programme Outcomes | CTPO | TOA | | Upon successful completion of the course, the students will be able to : | | | | PO - 1 : | learn fundamental concepts related to surface analysis technologies | 1,5 | 1,3 | | PO - 2 : | learn vacuum technologies | 1,5 | 1,3 | | PO - 3 : | learn and interpret spectroscopic methods of surface analysis techniques | 1,5 | 1,3 | | PO - 4 : | learn and interpret microscopic methods of surface analysis techniques | 1,5 | 1,3 | | CTPO : Contribution to programme outcomes, TOA :Type of assessment (1: written exam, 2: Oral exam, 3: Homework assignment, 4: Laboratory exercise/exam, 5: Seminar / presentation, 6: Term paper), PO : Learning Outcome | | |
| Introduction to surface analysis Vacuum technology in surface science Auger electron spectroscopy- introduction and principles. Secondary Ion mass spectroscopy-surface mass spectroscopy. Scanning electron microscopy (SEM) in surface science X-ray photoelectron spectroscopy principles and application areas. Introduction to scanning tunneling microscope (STM) Principles of Atomic force microscope (AFM). Applications of Atomic force microcope Applications of infrared spectroscopy in surface analysis Raman spectroscopy and its applications. |
| |
| Course Syllabus | | Week | Subject | Related Notes / Files | | Week 1 | Introduction to Fundamental Concepts | | | Week 2 | Definition of surface analysis and techniques | | | Week 3 | Vacuum Technology in surface science | | | Week 4 | Auger electron spectroscopy (AES) | | | Week 5 | Secondary Ion mass spectroscopy-surface mass spectroscopy (SIMS) | | | Week 6 | Midterm exam-I | | | Week 7 | X-ray photoelectron spectroscopy (XPS) | | | Week 8 | Scanning electron microscopy (SEM) | | | Week 9 | A Lab study with Scanning electron microscopy (SEM) | | | Week 10 | Scanning Tunneling Microscope (STM) | | | Week 11 | Atomic force microscope (AFM) | | | Week 12 | Midterm exam-II | | | Week 13 | Infrared spectroscopy (FTIR) | | | Week 14 | Raman Spectrsocopy | | | Week 15 | General Overview | | | Week 16 | End-of-term exam | | | |
| 1 | John C. Vickerman, Surface Analysis; The Principal Techniques, (2nd Edition) Wiley 2009 | | | |
| 1 | P E J Flewitt , R K Wild, Physical Methods for Materials Characterisation, IOP, 2003 | | | 2 | Gernot Friedbacher and Henning Bubert, Surface and Thin Film Analysis, Wiley,2011 | | | |
| Method of Assessment | | Type of assessment | Week No | Date | Duration (hours) | Weight (%) | | Mid-term exam | 6,12 | | 2 | 30 | | Homework/Assignment/Term-paper | 3,5,7,9,13 | | | 20 | | End-of-term exam | 16 | | 2 | 50 | | |
| Student Work Load and its Distribution | | Type of work | Duration (hours pw) | No of weeks / Number of activity | Hours in total per term | | Yüz yüze eğitim | 3 | 14 | 42 | | Sınıf dışı çalışma | 5 | 14 | 70 | | Laboratuar çalışması | 0 | 0 | 0 | | Arasınav için hazırlık | 5 | 7 | 35 | | Arasınav | 2 | 1 | 2 | | Uygulama | 0 | 0 | 0 | | Klinik Uygulama | 0 | 0 | 0 | | Ödev | 5 | 5 | 25 | | Proje | 0 | 0 | 0 | | Kısa sınav | 0 | 0 | 0 | | Dönem sonu sınavı için hazırlık | 5 | 7 | 35 | | Dönem sonu sınavı | 2 | 1 | 2 | | Diğer 1 | 0 | 0 | 0 | | Diğer 2 | 0 | 0 | 0 | | Total work load | | | 211 |
|