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| METL5051 | New Methods in Materials Characterization | 3+0+0 | ECTS:7.5 | | Year / Semester | Spring Semester | | Level of Course | Second Cycle | | Status | Elective | | Department | DEPARTMENT of METALLURGICAL and MATERIALS ENGINEERING | | Prerequisites and co-requisites | None | | Mode of Delivery | Face to face | | Contact Hours | 14 weeks - 3 hours of lectures per week | | Lecturer | Prof. Dr. Aykut ÇANAKÇI | | Co-Lecturer | | | Language of instruction | Turkish | | Professional practise ( internship ) | None | | | | The aim of the course: | | To introduce well-known metallographic techniques in materials characterization as a practical and comprehensive, X-rays teaches the microstructure analysis by diffraction, Microscopy methods, materials characterization of the teachings, thermal analysis methods teaches characterization method teaches you how to prepare the sample, it teaches you how to do the microstructure analysis by using characterization result. |
| Programme Outcomes | CTPO | TOA | | Upon successful completion of the course, the students will be able to : | | | | PO - 1 : | Describe different types of light microscopy; able to prepare samples, perform light microscopy and image analysis for determination of microstructure of some engineering materials.
| 1,4,6 | 1,3,5, | | PO - 2 : | Explain the various types, function, instrumentation, and electron sample interactions of scanning electron microscopes. | 1,4,6 | 1,3,5 | | PO - 3 : | Describe and perform surface chemical analysis by Energy Dispersive X-ray Analysis and X-ray mapping. | 1,4,6 | 1,3,5 | | CTPO : Contribution to programme outcomes, TOA :Type of assessment (1: written exam, 2: Oral exam, 3: Homework assignment, 4: Laboratory exercise/exam, 5: Seminar / presentation, 6: Term paper), PO : Learning Outcome | | |
| Quantitative Metallography, Image Analysis, Electron Microscope (Electron-Surface Interactions and Instrumentations), Types of Electron Microscopes, Scanning Electron Microscope (SEM), Transmission Electron Microscope (TEM), Scanning Tunneling Electron Microscope (STEM) and Field Ion Microscope (FIM), Chemical Analysis (Energy Dispersive Spectrometry (EDS), Wavelength Dispersive Spectrometry (WDS)), Other Analysis Methods, Atomic Force Microscopy, Auger Electron Spectroscopy, X-Ray Fluorescence Analysis (XRF), X-Ray Diffraction Analysis (XRD), Thermal Analysis Methods, Cooling Curves, Dilatometer, DTA, DSC, TGA.
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| Course Syllabus | | Week | Subject | Related Notes / Files | | Week 1 | a) Overview of characterization methods Materials
b) The method of analysis issues must be considered when selecting | | | Week 2 | Properties of X-rays
a) The electromagnetic spectrum
b) formation of X-rays
c) The continuous spectrum
d) Characteristic spectrum
e) Moosley relationship
f) Absorption
g) filtering the X-rays | | | Week 3 | Geometry of Crystals
a) cage structures
b) the direction of
c) Planes
| | | Week 4 | d) the distance between planes
and) lattice positions
and) Crystal structures
g) Interstitial positions | | | Week 5 | a) Phase Status
b) Bragg equation
c) diffraction pattern
d) non-ideal cases diffraction
e) from a single atom scattering
f) Scattering factor
g) Unit cell scattering
h) Structure factor
i) structure factor calculations
j) Product effect | | | Week 6 | Experimental Methods
a) The sample types and issues to be considered
b) describes the operation principle of the X-ray diffraction apparatus and the experimental procedure
Demonstration
c) Interpretation of the test results
d) Hanavalt method
e) Solved Problems | | | Week 7 | Microscopy Method
a) Comparison of Microscopy
b) Resolution
c) light and electronic comparison
d) Optical microscope
e) Converging lenses
f) Close visibility
g) Optical microscope image formation | | | Week 8 | Midterm | | | Week 9 | Scanning electron microscope
a) Uses
b) Advantages and disadvantages
c) Microscope column
d) electron guns
e) Electronic sample interaction
f) secondary electron mode
g) backscattered mode
h) Growth rate
ii) EDS analysis
j) WDS analysis
k) A comparison of EDS and WDS | | | Week 10 | X-ray fluorescence analysis, Auger spectroscopy and transmission electron microscope
a) chemical analysis by fluorescence X-ray method
b) Applications
c) EDS and XRF comparison
d) Auger process
e) Auger spectrum
f) Applications
g) Transmission electron microscope column
h) bright field image
ii) the electron energy loss (EELS) image
j) High-resolution transmission electron microscopy (HREE I)
k) scanning electron microscope TEM-comparison | | | Week 11 | Atomic Force Microscopy (AFM) and Scanning Tunneling Microscope (STEM)
a) Atomic force microscopy
b) Contact mode
c) Applications
d) Scanning tunneling microscope
e) Working principle
f) Uses
g) comparison of AFM and STM | | | Week 12 | Thermal Analysis Methods
a) Differential Thermal Analyzer (DTA)
b) The use of the DTA and some examples
c) Differential Scanning Calorimetry (DSC)
d) Application of DSC and some examples
e) Dilatometry | | | Week 13 | Sample preparation
a) Sample cutting and molding
b) Grinding
c) Polishing
d) Etching | | | Week 14 | Quantitative Analysis of Microstructure
a) Particle size measurement
b) Determination of particle size distribution
c) determining the volume ratio of the phases | | | Week 15 | Quantitative Analysis of Microstructure
a) Particle size measurement
b) Determination of particle size distribution
c) determining the volume ratio of the phases | | | Week 16 | Final Exam | | | |
| 1 | Edited by Brundle C.B., Evans C.A., Jr, and Wilson S. 1992; Encyclopedia of Materials Characterization, , Butterworth-Heinemann. | | | 2 | Voort , G. F. V. 1984; Metallography, McGraw-Hill. | | | |
| 1 | Geçkinli,A.E. 1989; " Metalografi ", İTÜ Matbaası, İstanbul. | | | 2 | Rossiter B. 1991; Microscopy, Second Edition. | | | |
| Method of Assessment | | Type of assessment | Week No | Date | Duration (hours) | Weight (%) | | Mid-term exam | 8 | 13/04/2018 | 2 | 30 | | Presentation | 12 | 20/07/2018 | 1 | 10 | | Homework/Assignment/Term-paper | 13 | 27/05/2018 | 2 | 10 | | End-of-term exam | 16 | 16/06/2018 | 2 | 50 | | |
| Student Work Load and its Distribution | | Type of work | Duration (hours pw) | No of weeks / Number of activity | Hours in total per term | | Yüz yüze eğitim | 3 | 14 | 42 | | Arasınav için hazırlık | 3 | 8 | 24 | | Arasınav | 1 | 2 | 2 | | Ödev | 4 | 2 | 8 | | Dönem sonu sınavı için hazırlık | 8 | 3 | 24 | | Dönem sonu sınavı | 1 | 2 | 2 | | Total work load | | | 102 |
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