|
ESM2013 | Electronic-I | 2+0+0 | ECTS:4 | Year / Semester | Fall Semester | Level of Course | First Cycle | Status | Elective | Department | DEPARTMENT of ENERGY SYSTEMS ENGINEERING | Prerequisites and co-requisites | None | Mode of Delivery | | Contact Hours | 14 weeks - 2 hours of lectures per week | Lecturer | Dr. Öğr. Üyesi Ömür AKYAZI | Co-Lecturer | | Language of instruction | Turkish | Professional practise ( internship ) | None | | The aim of the course: | The students should obtain a basic knowledge on the fundamental components used in electronics. |
Learning Outcomes | CTPO | TOA | Upon successful completion of the course, the students will be able to : | | | LO - 1 : | Understand better basic electronics concepts | 1 - 5 | 1, | LO - 2 : | Understand better semiconductors devices | 1 - 5 | 1, | LO - 3 : | Analyse V-I characteristic of semiconductor diodes, transistors | 1 - 5 | 1, | LO - 4 : | Understand better semiconductor diode and transistor circuits | 1 - 5 | 1, | CTPO : Contribution to programme outcomes, TOA :Type of assessment (1: written exam, 2: Oral exam, 3: Homework assignment, 4: Laboratory exercise/exam, 5: Seminar / presentation, 6: Term paper), LO : Learning Outcome | |
Semiconductor : p-type semiconductor , n-type semiconductor , the p-n junction. Diodes : The open-circuited p-n junction , the Volt-Ampere characteristic , the temperature dependence of the V/ I characteristic , diode resistance , diode capacitance , breakdown diodes , the load-line concept , linear diode model , diode switching times , a breakdown-diode voltage regulator , clipping circuits , rectifiers , other diode circuits , capacitor filters , small-signal analysis. BJT : The junction transistor , transistor construction , the Common-Base (CB) , the Common-Emitter (CE) , the Common-Collector (CC) configurations , on , cutoff , saturation regions , transistor ratings , transistor switching times , the operating point of a BJT , bias stability , self-bias or emitter bias , stabilization against variations in ICO , VBE , and b. JFET : The junction field-effect transistor , the Volt-Ampere characteristic , the enhancement MOSFET , the depletion MOSFET , MOSFET inverter , MOSFET logic gates , complementary MOSFET , the operating point of a JFET. |
|
Course Syllabus | Week | Subject | Related Notes / Files | Week 1 | p-type semiconductor, n-type semiconductor, the p-n junction. | | Week 2 | the current components of a diode, The Volt-Ampere characteristics, the temperature dependence of the V/I charecteristic, application | | Week 3 | Diode resistance, diode capacitance, diode switching times, application | | Week 4 | zener diode, tunnel diode, the load-line concept, linear diode model | | Week 5 | Fotodiode, led, display, fotovoltaic effect | | Week 6 | Clipping circuits, clamping circuits, application | | Week 7 | Rectifiers, other diode circuits | | Week 8 | The junction transistor, the Common-Base(CB), the Common-Emiter(CE), the Common-Collector(CC) configurations. | | Week 9 | Mid-term exam | | Week 10 | on, cutoff, saturation regions of a BJT, application | | Week 11 | Foto transistor, transistors switching times, the operation points of BJT | | Week 12 | Bias stability | | Week 13 | The junction field-effect transistor, the Volt-Ampere characteristic | | Week 14 | MOSFET, the MOSFET types | | Week 15 | MOSFET circuits,CMOS, the operation point of a JFET, application | | Week 16 | End-of-term exam | | |
1 | AYDEMİR, M., Timur, 2013, Temel Mühendislik Devre Analizi | | 2 | MORGÜL, Avni,2016; Elektronik Devre Elemanları, PapatyaBilim Üniversite Yayıncılığı, İstanbul | | |
Method of Assessment | Type of assessment | Week No | Date | Duration (hours) | Weight (%) | Mid-term exam | 9 | 26.11.2021 | 2 | 50 | End-of-term exam | 16 | 14.01.2022 | 2 | 50 | |
Student Work Load and its Distribution | Type of work | Duration (hours pw) | No of weeks / Number of activity | Hours in total per term | Yüz yüze eğitim | 3 | 14 | 42 | Sınıf dışı çalışma | 2 | 14 | 28 | Arasınav için hazırlık | 2 | 7 | 14 | Arasınav | 2 | 1 | 2 | Ödev | 2 | 10 | 20 | Dönem sonu sınavı için hazırlık | 2 | 12 | 24 | Dönem sonu sınavı | 2 | 1 | 2 | Total work load | | | 132 |
|