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FACULTY of ENGINEERING / DEPARTMENT of ELECTRICAL and ELECTRONICS ENGINEERING
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FACULTY of ENGINEERING / DEPARTMENT of ELECTRICAL and ELECTRONICS ENGINEERING / (30%) English
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ELK2012Electronics - I3+0+2ECTS:5
Year / SemesterSpring Semester
Level of CourseFirst Cycle
Status Compulsory
DepartmentDEPARTMENT of ELECTRICAL and ELECTRONICS ENGINEERING
Prerequisites and co-requisitesDC must have been achieved from ELK1002-Fundementals of Electrical Engineering
Mode of DeliveryFace to face
Contact Hours14 weeks - 3 hours of lectures and 2 hours of laboratory per week
LecturerProf. Dr. İsmail Hakkı ÇAVDAR
Co-LecturerPROF. DR. İsmail Hakkı ÇAVDAR,
Language of instructionTurkish
Professional practise ( internship ) None
 
The aim of the course:
The students should obtain a basic knowledge on the fundamental components used in electronics.
 
Learning OutcomesCTPOTOA
Upon successful completion of the course, the students will be able to :
LO - 1 : understand better basic electronics concepts1,2,5,11,131
LO - 2 : understand better semiconductors devices1,2,5,11,131
LO - 3 : analyase V-I characteristic of semiconductor diodes, transistors1,2,5,11,131
LO - 4 : understand better semiconductor diode and transistor circuits1,2,5,11,131
CTPO : Contribution to programme outcomes, TOA :Type of assessment (1: written exam, 2: Oral exam, 3: Homework assignment, 4: Laboratory exercise/exam, 5: Seminar / presentation, 6: Term paper), LO : Learning Outcome

 
Contents of the Course
Semiconductor : p-type semiconductor , n-type semiconductor , the p-n junction. Diodes : The open-circuited p-n junction , the Volt-Ampere characteristic , the temperature dependence of the V/ I characteristic , diode resistance , diode capacitance , breakdown diodes , the load-line concept , linear diode model , diode switching times , a breakdown-diode voltage regulator , clipping circuits , rectifiers , other diode circuits , capacitor filters , small-signal analysis. BJT : The junction transistor , transistor construction , the Common-Base (CB) , the Common-Emitter (CE) , the Common-Collector (CC) configurations , on , cutoff , saturation regions , transistor ratings , transistor switching times , the operating point of a BJT , bias stability , self-bias or emitter bias , stabilization against variations in ICO , VBE , and b. JFET : The junction field-effect transistor , the Volt-Ampere characteristic , the enhancement MOSFET , the depletion MOSFET , MOSFET inverter , MOSFET logic gates , complementary MOSFET , the operating point of a JFET.
 
Course Syllabus
 WeekSubjectRelated Notes / Files
 Week 1p-type semiconductor, n-type semiconductor, the p-n junction.
 Week 2the current components of a diode, The Volt-Ampere characteristics, the temperature dependence of the V/I charecteristic, application
 Week 3Diode resistance, diode capacitance, diode switching times, application
 Week 4zener diode, tunnel diode, the load-line concept, linear diode model
 Week 5Fotodiode, led, display, fotovoltaic effect
 Week 6Clipping circuits, clamping circuits, application
 Week 7Rectifiers, other diode circuits
 Week 8The junction transistor, the Common-Base(CB), the Common-Emiter(CE), the Common-Collector(CC) configurations.
 Week 9Mid-term exam
 Week 10on, cutoff, saturation regions of a BJT, application
 Week 11Foto transistor, transistors switching times, the operation points of BJT
 Week 12Bias stability
 Week 13The junction field-effect transistor, the Volt-Ampere characteristic
 Week 14MOSFET, the MOSFET types
 Week 15MOSFET circuits,CMOS, the operation point of a JFET, application
 Week 16End-of-term exam
 
Textbook / Material
1Millman, J. 1985, MICROELECTRONICS :Digital and Analog Circuits and Systems, McGraw-HILL.
 
Recommended Reading
1Demircioğlu, Türen, 2000, Electronic Circuits: Solved Problems.
2Millman, J., 1988, MICROELECTRONICS, McGraw-HILL.
3Boylestad, R. / Nashelsky, L.,1972, Electronic Devices and Circuit Theory, Prentice-HALL.
4Schilling D. L. / Belove, C., 1989, ELECTRONIC CIRCUITS, McGraw-HALL.
 
Method of Assessment
Type of assessmentWeek NoDate

Duration (hours)Weight (%)
Mid-term exam 9 2 50
End-of-term exam 16 2 50
 
Student Work Load and its Distribution
Type of workDuration (hours pw)

No of weeks / Number of activity

Hours in total per term
Yüz yüze eğitim 3 14 42
Sınıf dışı çalışma 2 14 28
Arasınav için hazırlık 15 1 15
Arasınav 2 1 2
Dönem sonu sınavı için hazırlık 18 1 18
Dönem sonu sınavı 2 1 2
Diğer 1 18 1 18
Diğer 2 2 1 2
Total work load127